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High Speed USB Interface Frame Grabber For Chip Packaging Testing

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High Speed USB Interface Frame Grabber For Chip Packaging Testing

Brand Name : Dothinkey

Model Number : ULM928

Certification : CE

Place of Origin : Shenzhen, China

MOQ : 1 PCS

Price : USD1200-USD5000

Payment Terms : T/T

Supply Ability : Stock Availability

Delivery Time : 5-8 working days

Packaging Details : Carton Packaging

Interface : USB3.0

Model No : ULM928

Weight : 0.47Kg

Working Temperature : 0℃ ~ 55℃

Output current : 1A

Output voltage : 12V/DC

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High Speed USB Interface Frame Grabber For Chip Packaging Testing

1.Features:

a.High-speed LVDS channels, supporting up to 10 lanes with data bandwidth up to 600Mbps per lane.

b.High-speed MIPI channels, supporting up to 4 lanes with data bandwidth up to 1Gbps per lane.

c.Ultra-high-speed USB3.0 interface, easy to use with data bandwidth up to 5Gbps.

d.Precision instrument-level Dynamic/Standby current detection technology. High-accuracy Open/Short testing, also suitable for chip packaging testing.

e.5-channel high-precision, low-noise programmable SENSOR power supply.

f.Exceptional camera module compatibility, supporting most MIPI, HISPI, DVP, SPI, and SUB-LVDS format modules on the market.

2.Function

a.Can supports DVP format module testing with maximum PCLK frequency: 200MHz.

b.Supports HISPI format module testing.

c.Supports SPI format module testing.

3.Description:

a.Function test box, simultaneously supporting MIPI Module test boards in formats such as HISPI, DVP, SPI, and SUB_LVDS.

b.The ULM928 is equipped with current detection technology at the level of precision instruments, with a minimum resolution of up to 10nA, making it more accurate and convenient to measure the standby current of sensors.

c.There are 5 independent high-precision and low-noise digital DC Sensor power supplies, including AFVCC, AVDD, DOVDD and DOVD, which support a maximum single-channel 3.3V/500mA power supply.

d.High-precision Open/Short detection technology and supports up to 45 channels of open and short circuit detection. Supports 15mA high-current open and short-circuit testing. Flexible OS test voltage and test current Settings make the test results closer to the true values.

4.Dimension drawing:

1)Main view:

High Speed USB Interface Frame Grabber For Chip Packaging Testing

2)Top View:

High Speed USB Interface Frame Grabber For Chip Packaging Testing

5.Application:

Mobile phone/automotive/monitoring camera, MIPl/DVP/HISPI/ LVDS.

6.FAQ:

Q:What is the warranty period?

A:1-year warranty.

Q:What is the lead time?

A:Standard productis ship within 5-8 working days.

Q: Do you provide technical support?

A: Yes, we offer professional technical support, including remote guidance and after-sales service.

Q: Are you a factory?

A: Yes, we are a manufacturer specializing in high-quality image sensor testing equipment and camera module testing solutions.


Product Tags:

USB Interface Frame Grabber

      

Chip Packaging Testing Frame Grabber

      

High Speed USB Frame Grabber

      
Quality High Speed USB Interface Frame Grabber For Chip Packaging Testing for sale

High Speed USB Interface Frame Grabber For Chip Packaging Testing Images

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